Showing results: 631 - 645 of 664 items found.
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ANET3910 -
AIM GmbH
STANAG3910/EFEX Test and Simulation module for Standard Ethernet. The ANET embedded Linux Operating System gives the unique capability to run the optional PBA.pro Engine right in the box. Another option is the ANET-ADK onboard software development kit where users create run-time applications (e.g. STANAG3910/EFEX to Ethernet Converter, STANAG3910/EFEX to Ethernet Gateway) to execute right in the box. For wireless applications, an ANET compatible USB Wifi dongle is optionally available.The capability to execute Python scripts in the ANET is a standard feature. For applications with multiple ANET devices AIM offers the ADock ANET Docking Station to host up to 4 ANET modules.
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SSA3000X-R -
SIGLENT Technologies
The SIGLENT SSA3000X-R real-time spectrum analyzers are powerful and flexible tools for complex RF signal monitor and analysis. With a capability of 40 MHz analysis bandwidth and 7.2 µs 100% POI, the analyzer can provide multi-dimensions data displays, advanced triggering, and RF data capturing, to solve modern RF spectrum challenges, like hopping frequency, conflict channel, spectrum interference, etc. They also provide standard tracking generator for network analysis, optional wideband digital modulation analysis, and EMI pre-compliance test. Applications include broadcast monitoring/evaluation, cellular site, IoT, WiFi, Bluetooth surveying, research and development, education, production, and maintenance.
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PeakTech Prüf- und Messtechnik GmbH
This innovative combination meter for testing electrical installations according to VDE 0100 convinces by its technical performance in the high-end range.With the large 3.5 "TFT color display all important safety checks as the RCD-, Voltage-, Loop-, Low-Ohm, Earth resistance and Insulation tests for annual safety-checks and newly installed systems can safely be carried out by the responsible electrical engineer.Since this new development was designed only according to the latest standards, the required measuring values can be even more convenient stored with an App (iOS / Android) via Bluetooth on the mobile phone, saved to an SD card or, when work is completed, from the internal data memory via USB connection to a PC.
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Teledyne LeCroy
Compute Express Link (CXL) is a new high-speed CPU-to-Device and CPU-to-Memory interconnect designed to accelerate next-generation data center performance. CXL technology maintains memory coherency between the CPU memory space and memory on attached devices, which allows resource sharing for higher performance, reduced software stack complexity, and lower overall system cost. This permits users to simply focus on target workloads as opposed to the redundant memory management hardware in their accelerators. CXL is based on a PCI Express 5.0 Physical layer with speeds up to 32GT/s. Teledyne LeCroy provides protocol analysis test equipment to support development and debug of CXL based devices.
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CAMI Research Inc. (CableEye®)
A USB Type-C test interface board for CableEye® cable and harness testing systems. Consisting of a daughter board, populated with two USB-C female connectors, it allows users to continuity-check USB Type-C terminated cables using the CableEye tester while seeing the connectors-under-test rendered graphically. The CB26U fits all CableEye models. Configuration A leader in development of PC-based cable and wire harness, continuity, resistance and hipot test systems for over 20 years, CAMI offers the CableEye suite of products complete with accessories – including “connector boards”. The selection of these test fixture boards is constantly growing and is currently numbering over 60 – most of which are populated with ‘families’ of connectors. When pre-populated boards are used, the tester GUI automatically displays a graphic of the connectors under test. Sold as a set of two boards, each CB26U accepts two USB Type-C connectors. In addition to the latest CableEye software, it requires the CB26 small-frame motherboard (Item 756) for operation, and plugs into one of two available slots – two USB-C-connectors can be tested simultaneously. The CB26 (with CB26U) attaches to the tester like a regular connector board. Contact sales@camiresearch.com or +1 (978) 266-2655 for a quote.
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RFS set -
Langer EMV-Technik GmbH
The RFS set consits of three passive near field probes designed for the use in a measurement scanner during the development of E-field and magnetic field. They are designed for frequency ranges of 30 MHz to 3 GHz. The probe heads of the RFS set allow for close measurements needed to correctly localize interference sources on an electronic assembly. They document the whole image of the device under test`s near field. The scanner probes have a sheath current attenuation and are electrically shielded. They are connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance. The measuring signal can be increased with PA 203 or PA 303 preamplifier. On request RFS, LFS and XFS scanner probes can be produced.
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IT6000D Series -
I-TECH Electronic Co., Ltd
IT6000D, single channel output programmable DC power supply, is applicable in laboratories and automatic test system to provide high-power and stable DC supply. The feature of autoranging output enables a wide range of voltage and current combinations at full power, unprecedentedly flexible. IT6000D Series has wide range of applications and its single unit provides power range of 6kW to 144kW, current up to 2040A, as well as its voltage up to 2250V. Besides, IT6000D provides multi built-in communication interfaces to simplify and accelerate the testing development. The compact 3U design saves rack space. Multi units of the same model can be paralleled easily to have higher power and the maximum power can reach up to 1.152 MW.
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PDS Series -
Matrix Technology Inc.
This series of products is programmable DC switching power supply with high accuracy and single output. It is light and compact, adjustable in voltage and current, and has multiple operating modes. The whole system is completely controlled by the microporcessor (mou), and can easily use the communication interface (re-232) to connect with the computer (PC) to meet the user's requirements for automatic testing and automatic control. The software instructions are completely in accordance with the scpi command. The format makes it easy for users to develop automatic test and automatic control applications. Due to the full digitalization of the system, the data input is completely controlled by the keyboard and knob, which is fast, accurate, and convenient. Can be widely used in electronic product development, device testing, communications industry, laboratories and scientific research institutions.
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North Atlantic Industries
NAI offers over 70 smart, field-proven function modules covering a wide variety of I/O, Measurement and Simulation, Communications, Ethernet switch and SBC functions. With Off-the-shelf development and quick integration speed, NAI's function modules provide the ability to reconfigure and respond to changing design specifications reducing NRE charges and offering obsolescence protection all with unmatched flexibility with countless hardware & software combinations. Each smart function module has dedicated FPGAs on-board with memory map-based configurability, programmable PID loop support and health monitoring via Built-In-Test. A single API provides programmability across all leading to a more I/O-intensive, distributed, smart and total cost-effective mission system.
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WDW-D series -
Jinan Testing Equipment IE Corporation
WDW series computer control electromechanical universal testing machines (UTM) is designed according to ASTM, ISO, DIN, EN standards etc.. It is computer-controlled and precision. Our electromechanical universal testing machine (UTM) is widely suitable for metallic and nonmetallic materials for tension, compression, bending, shearing and low cycle test. The electromechanical universal testing machine features as high precision, high stability and high reliability. Graph, test result display, data processing and printing can be done easily by its PC system and printer. Completed with modulus for metal, spring, textile, rubber, plastic and other material test, our electromechanical universal testing system is widely used in many fields such as industry factories, research and development, test institutes and training centers etc. WDW common series electromechanical universal testing machines (UTM) adopt rigid load frames, accurate load weighting system, advanced PCIE measuring & control system and intuitive modular application software. Configured with wide range of accessories for applications, the materials universal testing machines (UTM) can provide the best testing solutions for your individual application needs. With 20 years’ experience of materials testing industry and based on abundant application knowledge, we are completely capable of configuring the best solutions and more accurately testing systems for the manufacturers involved in load frame, core measuring and control elements, software package, grip/fixture that based on their specified test application and other requirements.
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WDW-S Series -
Jinan Testing Equipment IE Corporation
WDW series computer control electromechanical universal testing system for tension,compression, flexure testing is designed according to ASTM, ISO, DIN, EN standards etc.. The electromechanical universal testing system for tension,compression, flexure testing is computer-controlled and precision. Our electromechanical universal testing system for tension,compression, flexure testing is widely suitable for metallic and nonmetallic materials for tension, compression, bending, shearing and low cycle test. The electromechanical universal testing machine features high precision, high stability and high reliability. Graph, test result display, data processing and printing can be done easily by its PC system and printer. Completed with modulus for metal, spring, textile, rubber, plastic and other material test, the electromechanical universal testing system for tension,compression, flexure testing is widely used in many fields such as industry factories, research and development, test institutes and training centers etc. WDW-S series superior materials testing systems adopt robust load frames, precise load weighting system, advanced measuring and control system, and intuitive modular application software. Configured with wide range of accessories for applications, the materials testing systems can provide the best testing solutions for your individual application needs. With 20 years’ experience of materials testing industry and based on abundant application knowledge, we are completely capable of configuring the best solutions and more accurate testing systems for the manufacturers involved in load frame, core measuring and control elements, software package, grip/fixture that based on their specified test application and other requirements.
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Ponovo Power Co., Ltd.
With the development of power system, more and more digital substation based on IEC61850 has been built in the world. IEC61850 is the new communication protocol which is adopted by power system so as to change the analog complicated wiring connection and protocol conversion. Based on IEC61850, all Messages, such as GOOSE, SV, MMS, PTP, etc, could be communicated on the Ethernet via fiber optical cable connection. In China, the digital substation have started since 2003, until now there are already more than 6000 digital substation put on operation, China Power Grid is planning to build 5000 more new digital substations. PONOVO, as the leading power system testing solution provider, have launched plenty of IEC61850 digital testing tools, not only digital relay test set, but also MU test set, multi-functional analyzer, 24 hours online monitoring and analyzing system, etc so that users could have suitable testing equipment for the digital substation commissioning and testings.
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ARC Technology Solutions
In today’s fast paced manufacturing environment, where time to market and cost competitiveness is key, having a manufacturing partner like ARC can be a valuable resource for your company. ARC has a build-to-print manufacturing capability with our unique ‘engineer-to-print’ philosophy to make sure precision manufacturing and final build accuracy is top priority for your module level or system level builds. ARC can support up to several hundred module level assemblies (CCA subassemblies, cabling, mechanical and paneling elements) with abilities to perform a variety of software, embedded tasks and functional testing including a mixed signal test capability using our in-house MSAT (Mixed Signal Automated Tester) platform. We have a thorough process created through the development of our own products and test solutions. We know the importance of having a regimented manufacturing process, augmented with engineering expertise to address challenges that come up with building complex, high-mix, medium volume products.
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Inframet
IR FPA sensors are the most important modules of thermal imagers. Design of sensor electronics (camera core) is a crucial part of designing of new thermal imager. Knowledge of precise parameters of IR FPA sensor is needed by both professionals involved in both IR FPA technology/thermal imagers technology because parameters of IR FPA sensors determine performance limits of thermal imagers. Therefore test equipment that enable measurement of IR FPA sensors is a vital tool for development of both IR FPA technology/thermal imagers technology. It is commonly known that data sheets provided by manufacturers of IR FPA sensors (both cooled or non-cooled) provide too little details for electronics designers. Sometimes the provided data is not accurate enough and better sensor performance can be achieved using modified control signals. Therefore design teams loose sometimes years to develop electronic camera core optimized for a specific IR FPA sensor. When the type of the IR FPA sensor is changed the whole process is to be repeated. In this situation an universal, flexible camera core that would accept IR FPA sensors from different manufacturers and to carry out semi-automatic determination of optimal signal controls for a specific IR FPA sensor would be highly desirable.
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ProcVision -
Gidel
Gidel’s Vision Pro Development Kit is an optimal solution for developing,validating, demonstrating and evaluating Image Processing (IP) andpipeline designs on FPGA.The suite is designed to provide a complete and convenient envelop enablingthe developer to focus strictly on the proprietary image processingdesign. The entire Vision Pro flow is within a single FPGA, independentof the final target application(s). The Vision Pro flow is composedof a pipeline that streams simulated data to the user image processingdesign under test (DUT) and then captures the design’s output streamfor displaying, storing, analysis and/or co-processing on host software.The entire process is performed on a single FPGA without the need foradditional peripheral connectivity or tools.Vision Pro suite is plug-and-play enabling the developer to begin at oncethe IP design development and validation. A simple design example providesthe developer immediate hands-on familiarization with the systemflow and supporting tools. The final design can be ported to any IntelFPGA device or other vendors’ devices (FPGA or ASIC) by replacing basiclibraries. To significantly reduce compilation time, initial design developmentmay be on a small FPGA device and later compiled for the targetdevice(s). The target implementation may use any FPGA board. For a fullImaging/Vision system solution, Gidel offers a number of off-the-shelfgrabbers and FPGA accelerators that are designed to utilize these imageprocessing blocks and Gidel Imaging Library (GIL).
